AbstractThin films of chromium nitride deposited with varying concentrations of nitrogen on stainless steel substrates have been studied using Auger electron appearance potential spectroscopy (AEAPS). This technique provides information on the density of states in the conduction band. The chromium L2,3 levels have been investigated. The normalized AEAPS chromium spectra in the films have been compared with the elemental chromium spectrum. The signal strength at the Fermi level (EF) is observed to be larger in the films. This represents an increase in the density of states at EF for the films as compared with that of elemental chromium. However, in the films, the density of states is found to decrease with increasing nitrogen concentration. The binding energy of the chromium L3 level for the films exhibits a positive chemical shift with respect to elemental chromium. These spectral data indicate a direction of charge transfer from chromium to nitrogen. In the films, the charge transfer is observed to decrease with increasing nitrogen content. We also present a scheme to estimate the Coulomb correlation energy using the chromium L3 core‐level binding energy data obtained from AEAPS and x‐ray photoelectron spectroscopy (XPS). A decrease in the correlation energy with increasing nitrogen content is observed for the films. We also have estimated the total density of unoccupied states above EF from the experimental data. This total density is observed to be more in the films than in elemental chromium. In the films, the total density of states decreases with nitrogen concentration. The AEAPS spectral results have been correlated with our earlier XPS results on these films. Copyright © 2001 John Wiley & Sons, Ltd.
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