Year-end Sale % OFF 
Abstract
The information depth of AEAPS in comparison with AES was estimated using the overlayer technique. The strengths of the AES and AEAPS L 3 and L 1 signals of Cr and Ti were measured as a function of the Cr overlayer thickness on a Ti substrate. No significant differences between the information depths of both methods have been found. It follows that the information depth of AEAPS is basically limited by the mean free path of the primary electrons. Slight disagreement between the results obtained for the L 3 and L 1 subshells of Ti and Cr may indicate that the information depth of AEAPS could be modified by the kind of relaxation mechanism and the subsequent transport process.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
