Abstract
X-ray photoelectron spectroscopy combined with argon ion etching was applied for the investigation of the structure of the oxide layers developed on stainless steel surfaces having been exposed to ion-free water of different temperatures. Photoelectron intensity ratios measured as a function of the ion etching time given information on the composition and depth structure of the oxide layer as well as of the uppermost layers of the alloy. Stainless steel samples of three different types were exposed to the effect of ion and oxygen free water at 20°C and 250°C. In the case of the low temperature (20°C) envirinment a ≈3 nm thick oxide layer could be observed, while the oxide layers developed at high (250°C) temperature treatment were thicker than 8 nm. Samples of the three alloys showed very different chromium enrichment in the oxide layer and chromium depletion in the uppermost layer of the bulk. Results obtained make it possible to follow the effect of a given corrosive environment on the surface, and help to select the proper alloy for this environment.
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