Abstract
Sychrotron diffraction study of barium titanate films grown by molecular beam epitaxy method were performed in grazing incidence geometry. Thin barium titanate film with 8 nm thick was psudomorphic nature. Upper part of the film with 40 nm showed that c-axis lay parallel to the substrate surface and in the middle of the film a-axis lay along the surface. The region, where c-axis lies parallel to the substrate, is quite possible to be 90° domain of BT film.
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