Use of the α parameter method to calculate matrix corrections for infinitely thick targets (TTPIXE) with two different incident beam energies

Abstract

The α parameter correction method for calculating matrix effects in PIXE data does not require a priori knowledge of the major element composition of the matrix but implies the determination of a so-called α parameter linking two independent phenomena: X-ray absorption and proton energy loss. The method extrapolated to the infinitely thick targets (TTPIXE) has been previously studied using two PIXE measurements in two different geometric configurations. The present study deals with the possibility of using pairs of PIXE measurements at two different energies to obtain the α corresponding to thick samples (TTPIXE). The experimental conditions and error minimization problems are discussed. General tables allowing an easy use of the method are presented.