Abstract
The correction method for PIXE data described previously is based on the experimental determination of an α parameter linking two independent phenomena: X-ray absorption and proton energy loss. Using the α parameters, corrections can be calculated without making any hypothesis about the matrix composition. In this paper the best experimental conditions for obtaining the α parameters in the case of infinitely thick samples (TTPIXE) are studied. General tables and curves allowing an easy use of the method are given. Reference materials are used to test the precision of the method.
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