A new method (method of alpha parameters) for correcting PIXE measurements for matrix effects in infinitely thick samples

Abstract

The correction method for PIXE data described previously, based on measuring the proton energy loss ΔE of the incident beam passing through intermediate-thickness samples, is focused on an α parameter which links two independent phenomena: X-ray absorption and proton energy loss. The merit of this method is that hypotheses about sample composition are avoided. In this paper, the possibility of extrapolating the use of this parameter to deal with infinitely thick samples (TTPIXE) is demonstrated. The α parameter is calculated here by use of two PIXE measurements, where the energy of the incident beam or the geometry is modified. The precision and the choice of experimental conditions are discussed and the method is experimentally tested using reference samples.