Use of PIXE measurements performed at different proton energies to calculate matrix correction for infinitely thick targets (TTPIXE) within the framework of the α parameter method

Abstract

The correction method for PIXE data described previously is based on the experimental determination of an α parameter linking two independent phenomena: X-ray absorption and proton energy loss. Using the α parameters, corrections can be calculated without making any hypothesis about the matrix composition. Among other possibilities, the β parameters can be obtained from two PIXE measurements performed in the same geometrical conditions at two proton energies on a thick target (TTPIXE). General tables allowing an easy use of the method are given. The precision of the method is tested using reference materials.