Abstract
AbstractBy Monte Carlo simulations we investigate the plasma spectrum in n-type InGaAs field effect transistors at 300K in the whole region of operating conditions from ohmic to saturation regime of the transconductance characteristics. The presence of a two dimensional (2D) plasma peak predicted within the gradual channel approximation is confirmed by the microscopic model and its properties are analyzed systematically. At the highest gate voltages the 2D peak is found to become practically independent of the channel width.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
