Abstract
In this work, the track etch-rate VT and etch-rate ratio V of CR-39 detector irradiated by alpha particles was investigated at different incident angles. The change of the track etch-rate and etch-rate ratio along the particle trajectories showed that these functions are not affected by the inclination of the particle trajectory with respect to the normal on the detector surface.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IOP Conference Series: Materials Science and Engineering
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
