Abstract

Successive crystallization of amorphous Cr-Zr-O thin films, formation of the (Cr,Zr)2O3/(Zr,Cr)O2 nanocomposites and the thermally induced changes in the hexagonal crystal structure of metastable (Cr,Zr)2O3 were investigated by means of in situ high-temperature synchrotron diffraction experiments up to 1100°C. The thin films were deposited at room temperature by using reactive ion beam sputtering, and contained 3–15at.% Zr. At low Zr concentrations, chromium-rich (Cr,Zr)2O3 crystallized first, while the crystallization of zirconium-rich (Zr,Cr)O2 was retarded. Increasing amount of zirconium shifted the onset of crystallization in both phases to higher temperatures. For 3at.% of zirconium in amorphous Cr-Zr-O, (Cr,Zr)2O3 crystallized at 600°C. At 8at.% Zr in the films, the crystallization of (Cr,Zr)2O3 started at 700°C. At 15at.% Zr, the Cr-Zr-O films remained amorphous up to the annealing temperature of 1000°C. Metastable hexagonal (Cr,Zr)2O3 accommodated up to ~3at.% Zr. Excess of zirconium formed tetragonal zirconia, which was stabilized by chromium.

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