Abstract
Thermal capture of electrons and holes at zinc centers in silicon : J. M. Herman, III and C. T. Sah. Solid St. Electron.16 1133 (1973)
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https://doi.org/10.1016/0026-2714(74)90179-6
Journal: Microelectronics and Reliability | Publication Date: Feb 1, 1974 |
Thermal capture of electrons and holes at zinc centers in silicon : J. M. Herman, III and C. T. Sah. Solid St. Electron.16 1133 (1973)
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