Abstract
Quantitative Transmission Electron Microscopy is used to characterize the microstructure of an industrial Al-Mg-Si-Cu alloy (AA6056) in a state (T78 temper) desensitized to intergranular corrosion in comparison with the peak aged state (T6 temper). Analysis of Dark-Field images and of zero-loss filtered Selected-Area-Diffraction patterns, along with EDX spectroscopy, indicates an advanced precipitation of the quaternary phase containing Si and Cu in the T78-tempered alloy compared to the T6 one. This supports the current theory of the desensitization of AA6056 alloy. However, the application of EDX analysis to provide direct evidence of the chemical composition variation in the solid solution across the grain boundary appears less satisfactory.
Published Version
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