Abstract
We describe applications of a cantilever with a lead zirconate titanate (PZT) piezoelectric film as self-sensing to dynamic force microscopy (DFM) combined with Kelvin probe force microscopy (KFM). We adopted a frequency modulation (FM) detection method not only to stabilize the imaging conditions in our DFM but also to enhance the sensitivity for the detection of electrostatic forces in KFM measurement. We deposited Alq3 [tris (8-hydroxyquinolinato) aluminum] thin films and aluminum (Al) electrode patterns on an indium tin oxide (ITO)/glass substrate by vacuum evaporation using shadow masks. The surface structures and local surface potential of Alq3 films on metals were investigated using our DFM/KFM instrument to study the local electrical properties at the molecule–metal interface. The photosensitive organic material sample can be in a completely dark environment because no optics are required for cantilever deflection sensing in our experimental setup.
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