Year-end Sale % OFF 
Abstract
Lead Zirconate Titanate (PZT) film was synthesized by sol-gel technique on a silicon substrate. The raw materials used to synthesize the solution of PZT consist of lead acetate, zirconate nitrate and titanate (IV) isopropoxide and 2methoxy ethanol is used as a stabilizer for Ti structure. Acetic acid is the solvent used to solve lat acetate and zirconate nitrate. The XRD pattern of the sample shows that the film has a tetragonal phase with a perovskite structure. FESEM revealed the surface morphologies and the cross-section of the film. The different thicknesses of film and annealing temperatures are investigated in this work. The dielectric constant was measured at 1 kHz, PZT films have a dielectric constant value ( 312-552 ) and a dielectric loss (0.02-0.08) at ambient temperature. Keywords: PZT film; Lead zirconated titanate; ferroelectric properties; dielectric constant.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
