Abstract
Thin films of of various thicknesses (94-400 nm) were prepared either on glass or on quartz substrates. X-ray diffractograms show that in a powder form or annealed samples in thin film form have a single-phase chalcopyrite tetragonal structure with lattice parameters and with and distortion parameter . However, the as-deposited films may have a polycrystalline nature with very fine crystallites. The optical constants (the refractive index n, the absorption index k and the absorption coefficient ) of thin films of either as deposited or after being annealed for 2 h at 673 K were determined using the transmission T and reflection R at normal incidence of light in the wavelength range 400-2500 nm. The refractive index in both cases (as deposited and after being annealed) exhibits anomalous dispersion in the wavelength range 400-600 nm. The permittivity was found to be 6.12 and 6.02 for as deposited and after being annealed respectively. A plot of shows that these films, whether as deposited or after being annealed, have two direct allowed optical transitions which are attributable to the splitting of the valence band.
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