Abstract

In the approximate calculations of spreading resistance correction factors, two different types of boundary conditions over the source region have hitherto been assumed, viz., a uniform flux distribution, and the specific flux distribution that obtains in the classical solution for the infinitely thick slab. This paper presents results of a theory which has been derived for multilayer structures by using the uniform source flux distribution. The results given include those obtained for a series of exponentially-graded structures of varying steepness in the resistivity profile, whose thickness h 1 ranges from 0.1 to 10 times the circular source contact radius, a. The results show that, as a rule, for an insulating substrate and ( h′ 1/ a) < 0.5, the uniform flux assumption leads to correction factors which differ at most by about 3% from those derived from the infinitely-thick slab flux assumption, while for a conducting substrate and ( h′ 1/ a) = 0.1 to 10, there is a difference of about 8%. Whatever the nature of the resistivity profile studied, it has been found that the difference is never greater than about 8%.

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