Abstract
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden cores of many applications especially in space and avionic fields where reliability is becoming an important concern. In particular, for Flash-based FPGAs when adopted in those applications, the main concern is radiation-induced voltage glitched know as Single Event Transient (SET) in the combinational logic. In this work, a new CAD tool has been developed in order to evaluate the sensitivity of the implemented circuit regarding SET and to mitigate their effects. The proposed tool has been applied to an industrial design adopted by the EUCLID space mission including more than ten different modules. The experimental results demonstrated the feasibility and efficiency of proposed tool.
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