Abstract
A methodology for characterization of Propagation Induced Pulse Broadening (PIPB) effects concerning the Single Event Transients (SETs) propagation within logic and routing resources of Flash-based Field Programmable Gate Arrays (FPGAs) is presented. Electrical-based fault injection was performed on the FPGA board and at the electrical model. Experimental results matched the electrical simulations, which validate the effectiveness of the method.
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