Abstract
Low-power, flash-based field programmable gate arrays (FPGAs) have attracted significant attention in space electronic systems due to their re-programmability feature and non-volatility. In this study, we discussed a method for continuous and synchronous measurement of single event transient (SET) pulse widths in the ProASIC3 flash-based FPGA. The dedicated SET test system and irradiation set-up were implemented under heavy-ion irradiation. The SET generation cross-sections, pulse widths and capture characteristics in combinational logic chains were analyzed. The results indicated that the SET pulse width distribution exhibited a log-normal function and the SET capture probability linearly increased with the working frequency.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
