Abstract
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden core of many applications especially in space and avionic fields where reliability is an important concern. In particular, for Flash-based FPGAs, when adopted in those applications, the main concern is radiation-induced voltage glitches known as Single Event Transient (SET) in the combinational logic. In this work, a new CAD tool is presented for evaluating the sensitivity of the implemented circuit regarding SET and mitigating this effect. This tool has been applied to EUCLID space mission project including more than ten modules. The experimental results demonstrate the efficiency of the proposed tool.
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