Abstract
AbstractThe interaction of photographic stabilizers with the surface of silver bromide grains was studied to clarify the mechanism of sensitization caused by the stabilizers. The dielectric loss and Dember effect methods were applied to the measurement of the ioni conductivity of cubic silver bromide emulsions to which photographic stabilizers and their related compounds were added. The compounds with adsorptivity to silver bromide grains decreased the ionic conductivity of the emulsion grains, and increased the photographic sensitivity of the emulsions. It is considered that sensitization by the stabilizers arises from the interaction of their anions with silver ions at kink sites, which results in a decrea e in the concentration of interstitial silver ions.
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