Rutherford backscattering spectroscopy and surface morphology of amorphous As 2Se 3 films modified with complex compounds Ln(THD) 3 (Ln=Eu, Tb, Er, Yb)

Abstract

In this work we report the results on study of amorphous As 2Se 3 films modified with rare-earth dipivaloylmethanates Ln(THD) 3 (Ln=Eu, Tb, Er, Yb) using different diagnostic techniques. The rare-earth, oxygen and carbon concentrations have been determined by Rutherford backscattering spectroscopy and nuclear reaction analysis. The films have smooth surfaces with typical roughness the sizes of which have been changed with chemical modification. According to the results on nuclear microanalysis and IR spectroscopy the assumptions about the local environment of the rare-earth ions in amorphous matrix can be suggested.