Abstract
The validity of a new method for simulating high resolution electron microscope images has been critically examined. This method, which has been termed the Real Space (RSP) method since the entire calculation is performed withour any Fourier transforms, offers a considerable reduction in computing time over the conventional multislice approach when identical sampling conditions are employed. However, for the same level of accuracy the Real Space method requires more sampling points and more computing time than the conventional multislice method. These characteristics are illustrated with calculated results using both methods to identify practical limitations.
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