Abstract
Abstract A δ-ε criterion in the real-space (RS) method for simulating high-resolution electron microscope images has been derived. This condition imposes a practical limitation in choosing the sampling interval δ and the slice thickness ε for the RS method. The validity of the new criterion for the RS image simulation in high-resolution electron microscopy has been rigorously examined. It has been found that when the δ-ε condition is satisfied, the RS method gives results similar to the conventional multislice method with a saving in computational time but avoiding the computing divergence which can arise in the RS method.
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