Abstract
In a detailed study of the problem of induced numerical artifacts in the Real Space (RS) High Resolution Electron Microscopy (HREM) image simulation, a δ-ε criterion in the RS method for simulating HREM images has been derived. This condition imposes a practical limitation in choosing the sampling interval δ and the slice thickness ε for the RS method. It has been found that when the δ-ε condition is satisfied and a much more accurate formula is used for calculating the propagating factor p(r), the RS method gives results in satisfactory agreement with the conventional FFT multi-slice (FFTMS) method, but saving coputational time and avoiding the computing divergence that may arise in the RS method.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
