Random noise test of ADCs with a sinusoidal stimulus

Abstract

The recommended random noise test for analogue to digital converters (ADCs), as stated in the IEEE 1057 Standard for Digitizing Waveform Recorders, suggests the utilization of a triangular signal as the stimulus for the ADC under examination. However, we will demonstrate that an alternative option of employing a sinusoidal stimulus signal is equally feasible. This substitution provides enhanced flexibility during the testing process and enables the utilization of sine fitting algorithms.