Abstract
The present work reports some experimental results based on capacitance measurements on float-zone silicon (Fz-Si) and Czochralski-grown silicon (Cz-Si) subjected to oxygen implantation, subsequent neutron irradiation and finally high-pressure thermal anneals. The purpose of this work was the study of the effect of irradiation on the formation of thermal acceptors and donors in silicon. We found that oxygen ion implantation followed by neutron irradiation results in shallow and deep level acceptor-like defects formation. Prolonged heat treatment leads to thermal donor generation as usual in Cz-Si annealed at 720 K. The most striking result of the study is finding that high-pressure thermal anneals result in extra donor formation even for low oxygen concentration. The effects mentioned above lead to changes in the type of conductivity (p-n junction formation) depending on oxygen content in the material, hydrostatic pressure and an extent of damage caused by the irradiation.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
