Abstract
The electric potential distribution is given for an arbitrary placement of current contacts on one side of a rectangular bar of semiconductor material having finite dimensions and two conducting ends. A factor is derived which can be used in conjunction with a four-point probe to correct the measured conductivity of such a bar for the effects of its dimensions and plated ends. This factor is of utility in the correlation of conductivity measurements made on a single specimen by means of two- and four-point probes.
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