Abstract
The time dependence of third-harmonic generation in an optical material is modelled for an ultrafast pulse from a Ti : Sapphire laser. For normally dispersive materials, the group velocity mismatch of the fundamental and harmonic fields is significant. In the absence of phase matching, pulse breakup is observed. Thirdharmonic generation is governed by a bulk susceptibility, but is sensitive to material interfaces. It is shown that the sensitivity to interfaces is enhanced by group velocity walk-off, and that interface resolution is better than previously reported. It is possible to use the surface sensitivity to develop an interferometric microscopy tool for investigating thin films. The experimental technique is demonstrated on a thin AlN coating grown on a Al2O3 substrate. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
Published Version
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