Abstract
SUMMARY A high-performance, field-portable, multielement XRF analyzer has been developed based on a new semiconductor x-ray detector of Mercuric Iodide. Its use for on-site verification of alloy materials is enhanced by a compact handheld measurement probe design and ease of operation to simultaneously determine up to 21 elements with positive identification of 225-plus specified alloys. Materials of almost any shape or size can be analyzed and provisions are included for custom alloys and calibrations. Typical assay time is under 30s.
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