Abstract
A circuit design for technology of near-field interference microwave microscopy using evanescent fields of several active radiators (probes) is suggested and substantiated. The feasibility of providing the spatial overlap of the evanescent fields of two probes representing expanding coaxial conical horns is demonstrated. It is shown that the structure of the electromagnetic field in the region of overlap can effectively be controlled by changing the phase difference of oscillations arriving at inputs of the probes. This technology can be used for diagnostics of liquid media comprising dielectric inhomogeneities, flaw detection, and hygroscopy.
Highlights
More and more researchers direct their attention to investigation of possibilities of near-field microwave diagnostics [1,2,3,4,5,6,7]
Such diagnostics involves medical and industrial applications, but in both cases restriction is imposed on the depth of field penetration into the examined medium or object
The penetration depth is of the order of the near field zone at the maximum wavelength from the frequency band of a probing signal
Summary
More and more researchers direct their attention to investigation of possibilities of near-field microwave diagnostics [1,2,3,4,5,6,7]. The penetration depth is of the order of the near field zone at the maximum wavelength from the frequency band of a probing signal. This necessitates a rigid connection of the receiver and transmitter of the probing system, since the field scattered by the objects in the near field zone of such system must be fixed. For such unilateral technology of sensing, the choice of the signal frequency band, receiving antenna aperture area, and transceiving system scanning altitude is very important. Some considerations concerning the method of control over these fluxes for sensing of media, materials, and objects were presented
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