Abstract
This paper presents the results of implementation of National Instrument based system for Single Event Upset testing of memory chips into neutron generator experimental facility, which used for SEU tests for avionics purposes. Basic SEU testing algorithm with error correction and constant errors detection is presented. The issues of radiation shielding of NI based system are discussed and solved. The examples of experimental results show the applicability of the presented system for SEU memory testing under neutrons influence.
Highlights
The problem of Single Event Upset (SEU) in memory under influence of atmospheric neutrons and under secondary neutrons of physics facilities is well known [1–3]
Solving of the problem of SEU in memory under influence of neutrons is in prediction of the electronic components sensitivity to neutron irradiation [9] and in implementation of error correction methods utilizing the level of sensitivity
Keeping in mind that the distance from the neutron source is essential for the neutron flux we considered two cases of the geometry allowed by the length of the cable between the National Instrumen (NI) crate and the memory chip under test: (1) the NI crate is situated as far as possible from the target of the neutron generator, but still in the “shadow” created by the steel shield, and (2) the NI crate is situated about in the middle of a “shadow” but very close to the walls of the steel shield
Summary
The problem of Single Event Upset (SEU) in memory under influence of atmospheric neutrons and under secondary neutrons of physics facilities is well known [1–3]. The special algorithm and the hardware were developed on the basis of National Instrumen (NI) platform and NI LabVIEW 11.0 software Another part of the work is to supply safety operation of NI based system under influence of neutron fluxes of neutron generator. The distance between memory chip and NI based test system is about 2 meters and could not be larger taking into consideration the length of standard cables At this distance the level of irradiation is rather high to leave it unsolved: the risk of system failure due to neutron flux and total dose irradiation should be decreased to negligible levels. Keeping in mind the high penetration ability of neutrons there are only two ways to decrease the level of irradiation: (1) to increase the distance between the system crate and the neutron source, which is impossible for the length of cables, and (2) to mount an appropriate shield between them, which was one of the tasks of this work
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