NC-AFM 2003: Proceedings of the 6th International Conference on Non-contact Atomic Force Microscopy

Abstract

Direct nanoscale and atomic resolution imaging is a key issue in nanoscience and nanotechnology. The invention of the dynamic force microscope in the early 1990s was an important step forward in this direction as this instrument provides a universal tool for measuring the topography and many other physical and chemical properties of surfaces at the nanoscale. Operation in the so-called non-contact mode now allows direct atomic resolution imaging of electrically insulating surfaces and nanostructures which has been an unsolved problem during the first decade of nanotechnology. Today, we face a most rapid development of the technique and an extension of its capabilities far beyond imaging; atomically resolved force spectroscopy provides information about local binding properties and researchers now develop sophisticated schemes of force controlled atomic manipulation with the tip of the force microscope.Progress in the field of non-contact force microscopy is discussed at the annually held NC-AFM conferences that are part of a series started in 1998 with a meeting in Osaka, Japan. The 6th International Conference on Non-contact Atomic Force Microscopy took place in Dingle, Ireland, from 31 August to 3 September 2003 and this special issue is a compilation ofthe original publications of work presented at this meeting.The papers published here well reflect recent achievements, current trends and some of the challenging new directions in non-contact force microscopy that have been discussed during the most stimulating conference days in Dingle. Fundamental aspects of forces and dissipation relevant in imaging and spectroscopy have been covered by experimental and theoretical contributions yielding a more detailed understanding of tip--surface interaction in force microscopy. Novel and improved imaging and spectroscopy techniques have been introduced that either improve the performance of force microscopy or pave the way towards new functionalities and applications. With regard to studies on the specific systems investigated, there was a strong emphasis on oxides and ionics, as well as on organic systems.Following previous pioneering work in uncovering the atomic structure of insulating oxides with force microscopy, it was shown in the meeting that this important class of materials is now accessible for a quantitative atomic scale surface characterization. Single organic molecules and ordered organic layers are building blocks for functional nanostructures currently developed in many laboratories for applications in molecular electronics and sensor technologies. The Dingle conference impressively demonstrated that dynamic force microscopy is ready for its application as an analytical tool for these promising future nanotechnologies.The meeting was a great success scientifically and participants enjoyed the beauty of the conference site. I would like to thank all members of the international steering committee, the programme committee and the co-chairs, J Pethica, A Shluger and G Thornton, for their efforts in preparing the meeting.The members of the local organising committee, J Ballentine-Armstrong, G Cross, S Dunne, S Jarvis and Ö Özer, kept the meeting running smoothly and created a very pleasant atmosphere. The generous financial support from Science Foundation Ireland (SFI), is greatly appreciated; SFI is dramatically raising the profile of Irish science. I would also like to express my sincere gratitude to N Couzin and the journal team from Institute of Physics Publishing for their editorial management and perfect co-operation in the preparation of this special issue.