NC-AFM 2004: Proceedings of the 7th International Conference on Non-contact Atomic Force Microscopy

Abstract

With the ongoing miniaturization of devices and controlled nanostructuring of materials, the importance of atomic-scale information on surfaces and surface properties is growing continuously. The astonishing progress in nanoscience and nanotechnology that took place during the last two decades was in many ways related to recent progress in high-resolution imaging techniques such as scanning tunnelling microscopy and transmission electron microscopy. Since the mid-1990s, non-contact atomic force microscopy (NC-AFM) performed in ultrahigh vacuum has evolved as an alternative technique that achieves atomic resolution, but without the restriction to conducting surfaces of the previously established techniques. Advances of the rapidly developing field of NC-AFM are discussed at annual conferences as part of a series that started in 1998 in Osaka, Japan. This special issue of Nanotechnology is a compilation of original work presented at the 7th International Conference on Non-contact Atomic Force Microscopy that took place in Seattle, USA, 12–15 September 2004.Over the years, the conference grew in size and scope. Atomic resolution imaging of oxides and semiconductors remains an issue. Noticeable new developments have been presented in this regard such as, e.g., the demonstrated ability to manipulate individual atoms. Additionally, the investigation of individual molecules, clusters, and organic materials gains more and more attention. In this context, considerable effort is undertaken to transfer the NC-AFM principle based on frequency modulation to applications in air and liquids with the goal of enabling high-resolution surface studies of biological material in native environments, as well as to reduce the experimental complexity, which so far involves the availability of (costly) vacuum systems. Force spectroscopy methods continue to be improved and are applied to topics such as the imaging of the three-dimensional force field as a function of the distance with atomic resolution, the investigation of near-surface electronic states, the quantification of adhesion forces, and the lateral mapping of surface potentials. The origin of energy dissipation, which is closely related to an in-depth understanding of tip-surface interactions and imaging mechanisms, was the subject of an ongoing discussion and addressed by various theoretical, computational, and experimental contributions.A characteristic of the NC-AFM conference series is the lively and friendly atmosphere, which year after year stimulates scientific discussions between the participants. This time, the programme included 5 invited talks, 84 contributed presentations, and 113 participants; furthermore, three educational lectures were given as part of a pre-conference workshop targeted at NC-AFM newcomers, which was attended by 30 participants. I would like to thank the members of the international steering committee and the programme committee for their continued effort in organizing the meeting. Special thanks go to the chair of the programme and local organizing committees S Fain and the conference manager J Kvamme for making the meeting a success. Financial support is acknowledged from the corporate sponsors MikroMasch USA, Nanonis GmbH, Nanosurf AG, Omicron Nanotechnology, PSIA, Inc., and RHK Technology, as well as from the institutional sponsors National Science Foundation and PNNL/UW Joint Institute for Nanoscience. Finally, I would like to express my gratitude to everyone who participated in assembling this special issue including the authors, the reviewers, and, in particular, the excellent and experienced journal team from the Institute of Physics Publishing headed by Nina Couzin, for devoting their time and efforts so that we could make this issue a useful representation of the progress in NC-AFM while maintaining our tight publication schedule.In conclusion, I would like to mention that the Seattle conference was the first one of the NC-AFM series that took place in the USA. As such, it was part of a series of recent activities within the USA, which will help in establishing a strong domestic NC-AFM community.