Abstract

Field effect diodes (FEDs) are devices that have higher ON current and lower OFF current compared to metal oxide semiconductor field effect transistors in similar dimensions. The modified FED and side contacted FED (S-FED) structures do not turn off for 40 nm channel lengths and shorter by considering the band-to-band tunnelling model. In this study, a new structure of FED with a 25 nm channel is presented. In this structure, the use of isolating oxides and reservoirs in the channel causes improvement in the structural compared to the conventional FED structures. The proposed techniques reduce the tunnelling in the channel. The simulations have been done by using Silvaco TCAD. In the proposed structure, the results show that the OFF current and gate delay are decreased from 1.5 mA to 66.5 nA and 0.103 to 0.033 ps, respectively. Also, compared with the S-FED structure by considering the band-to-band tunnelling model, the knee voltage for the length of the 25 nm channel dropped from 0.8 to 0.4 volts. Furthermore, the I ON / I OFF ratio, which is an important parameter in digital applications, dramatically increases to a magnitude of 10 5 .

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