Abstract
The irregular growth of the intermediate phase layer which forms as a result of interdiffusion between U and Al has been studied. Using optical and scanning electron microscope examination techniques and electron-probe microanalysis, it has been determined that only one phase (UAl3) grows in the U-Al system and that the breakdown of interfacial planarity is a result of a limited nucleation rate and rapid growth rate of UA13. This phase partially decomposes near the uranium end of the diffusion couple during slow cooling, resulting in the formation of a “multiphase≓ region. No such region is observed in rapidly cooled specimens. X-ray diffraction indicates the absence of a preferential growth direction to the intermediate phase layer. A model is presented that describes the sequence of intermediate phase growth.
Published Version
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