Abstract
The temperature coefficient of resistance (TCR) values of gold and aluminum films deposited on glass substrates were obtained in the range of thickness from 20 nm to 200 nm at 298 K and atmospheric pressure conditions. Applying an electrical current and measuring simultaneously the corresponding changes of voltage (i.e., electrical resistance), and the change of temperature on the thin films, the TCR value was estimated. The measured TCR values show a decrement with the film thickness reduction, and their values are approximately 13.0 % lower than their corresponding bulk values mainly for thinner films. A comparison with previously reported cooper TCR values and the values estimated with the Tellier–Tosser model show good agreement with differences of about 5.0 % between them.
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