High room-temperature TCR and MR of La1-xSrxMnO3 thin films for advanced uncooled infrared bolometers and magnetic sensors

Abstract

Perovskite manganese films had promising applications in the field of photoelectronic materials and devices. However, the utilization of manganese films remained severely challenging due to high fabrication cost and inferior electrical and magnetic properties. Herein, La1-xSrxMnO3 (LSMO) thin films were fabricated on La0.3Sr0.7Al0.65Ta0.35O3 (LSATO) substrates using a facile sol–gel spin-coating technique. All the LSMO films displayed (001)-orientation with orthorhombic structure. The LSMO films exhibited high temperature coefficient of resistivity (TCR) and magnetoresistance (MR) values at room-temperature. The maximum TCR value was 10.4 % K−1 (301.2 K, for x = 0.175). This result can be attributed to high carrier concentration and mobility of optimal × content LSMO films with low film-substrate lattice mismatch (-0.4%), leading to low resistivity, and thus, increased TCR value. The maximum MR value reached 42.85% (290.95 K, for x = 0.150). The LSMO films with high room-temperature TCR and MR values are potential materials for advanced uncooled infrared bolometers and magnetic sensors.