Abstract
We report the first measurement of the longitudinal magnetic recording properties of as-deposited crystalline thin film barium ferrite media. Using facing target sputtering, randomly oriented crystalline barium ferrite (BaFe/sub 12/O/sub 19/, BaM) has been deposited onto an Ultra Densified Amorphous Carbon substrate, producing high quality films in-situ at a substrate temperature of 660/spl deg/C without any post-deposition annealing. In order to prevent diffusion of carbon into the BaM film, an underlayer of silicon nitride was first reactively sputtered. The BaM sputtering was carried out using targets made from substituted BaM powder which had a powder H/sub c/=1860 Oe (from Toda Kogyo) in a 10% O/sub 2//Ar gas mixture at 3 mTorr. The sputtered films had an in-plane H/sub c/=2100 Oe. The performance of the disk was compared to a commercial disk with cobalt alloy media with H/sub c/=1760 Oe. At a flying height of 75 nm the isolated pulse width, PW/sub 50/, was 0.67 /spl mu/m vs. 0.88 /spl mu/m for the commercial media using a ReadRite M84 thin film head with a gap of 0.3 /spl mu/m. Near its measured D/sub 50/ of 66 kfci the BaM media had a broad band signal/noise ratio (SNR) of 20 dB vs. 13 dB for the commercial media. >
Published Version
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