Abstract
Modifications induced by nanosecond Nd:YAG laser irradiation in the graphene oxide properties were investigated. To correlate the effects of laser irradiation with the modifications of the structural, chemical and electrical properties of graphene oxide, 2.5 MeV alpha particle and 2.0 MeV proton beams in Rutherford backscattering spectrometry and elastic recoil detection analysis, and also X-ray photoemission spectroscopy, have been employed. A high ratio of carbon to oxygen atoms was measured in the irradiated graphene oxide, with respect to the virgin one. The localized reduction of graphene oxide film is promising for patterning techniques useful for the graphene-based devices production.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
