Abstract
We present a generalized transfer field method with the microscopic noise sources directly connected with the velocity and energy change during single scattering events. The advantages of this method are illustrated by hydrodynamic calculations of current and voltage noise spectra in several two-terminal submicron structures.
Highlights
A standard technique to compute noise in electronic devices is the impedance field method [1,2], a deterministic approach able to provide analytical and numerical solutions for the noise spectra of electronic devices at a hydrodynamic level [3]
We find that the main contribution comes from the microscopic noise source related to velocity rates
Figure shows the contributions of microscopic noise sources connected with velocity and energy rates to the total value of the spectral density of voltage fluctuations calculated for a 0.21-0.30
Summary
A standard technique to compute noise in electronic devices is the impedance field method [1,2], a deterministic approach able to provide analytical and numerical solutions for the noise spectra of electronic devices at a hydrodynamic level [3]. Can represent various local physical quantities such as carrier concentration, average velocity, average energy, conduction current density, electric field, electrical potential, etc., G(x, Xo, r) is the singleparticle Green-function which describes the linear response of the H-characteristic at point x and time to a local perturbation of the dynamical variable a of a single particle at point x0 and time t-% and L is the device length. Ds exp(-icos)G(xo, s) is the generalized transfer field determined as the Fourier transform of the function G(xo,s) which gives the linear response of the global H(t)characteristic of the whole device (i.e., the conduction current flowing through the structure or the voltage drop between the structure terminals) to perturbations of velocity, energy and higher order moments (a u, c, etc.) appeared at point x0. In the case when fluctuations of local characteristics are considered, the spectral density of fluctuations takes a .form similar to Eqs. (4) and (5), Sm-l,(X, x’,v) will describe the crosscorrelation of fluctuations in two local points x and x’, and F(x, xo, t) will describe the response of the local H(x, t)-characteristic at point x to a perturbation of velocity, energy, etc., at point x0
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
