Abstract
During the last couple of years new measurement techniques have provided insight into the physics behind the negative bias temperature instability (NBTI) and indicate that the recoverable component of NBTI is due to some kind of charge trapping. As a consequence, charge trapping processes have been investigated and modeled in detail. We review the evolution of the latest charge trapping model by focussing on the correct temperature- and field dependence as well as on the quality of agreement with experimental stress/relaxation curves.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
