Abstract
High-energy synchrotron radiation has been demonstrated to be a powerful tool for materials characterization. The development of novel methodologies is still ongoing, driven by major technological advances regarding the available source brilliance and efficient large area detectors. The Swedish Materials Science beamline at PETRA III is dedicated to materials characterization by high-energy X-rays and scheduled to enter into user operation starting August 2019. The beamline has been designed in particular for the combination of two complementary techniques: wide and small angle scattering and imaging. The beamline design is presented briefly and the different techniques are reviewed with regard to the contrast mechanisms and the ability to obtain spatially resolved information.
Highlights
High-energy synchrotron radiation fills the important spatial and temporal resolution gap between electron microscopy and neutron diffraction, enabling the in situ investigation of bulk materials during e.g. thermo-mechanical processing
The Swedish Materials Science beamline at PETRA III is dedicated to materials characterization by high-energy X-rays and scheduled to enter into user operation starting August 2019
By combining different contrast mechanisms it has been demonstrated that important microstructure attributes such as crystallographic phase identification, orientation distributions, stress/strain state, size distributions and dislocation densities can be obtained
Summary
High-energy synchrotron radiation fills the important spatial and temporal resolution gap between electron microscopy and neutron diffraction, enabling the in situ investigation of bulk materials during e.g. thermo-mechanical processing. By combining different contrast mechanisms (e.g. attenuation, small and wide angle scattering) it has been demonstrated that important microstructure attributes such as crystallographic phase identification, orientation distributions, stress/strain state, size distributions and dislocation densities can be obtained. By forward- or back-projection of the detected intensity distributions, crystallographic orientation maps of the illuminated sample volume can be evaluated (comparable to electron back-scatter diffraction surface orientation maps) [2]. No space constraints are posed for sample environments Averaged quantities such as the position, size, crystallographic orientation, and the complete elastic strain tensor can be extracted. A large number of images must be recorded (cf. section 5)
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