Abstract
The spin Hall effect (SHE) of light is a useful metrological tool for characterizing the structure parameters' variations of nanostructure. In this letter, we propose using the SHE of light to identify the graphene layers. This technique is based on the mechanism that the transverse displacements in SHE of light are sensitive to the variations of graphene layer numbers.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
