Abstract

Using the thermal evaporation method, highly oriented CsCu2I3 thin films were prepared on GaN and quartz with CuI interlayers by adjusting the ratio of CsI:CuI. The mechanism of the growth of CsCu2I3 thin films on CuI interlayer was investigated. The enhanced CsCu2I3/GaN heterojunction UV photodetectors were constructed using the CsCu2I3 thin films deposited on the GaN epitaxial film with a 5 nm CuI interlayer. The fabricated heterojunction photodetectors demonstrated exceptional self-powered photoresponse characteristics, including a high on/off ratio of 2.5 × 104 at 0 V, peak responsivity of 46.91 mA/W and peak specific detectivity of 3.80 × 1012 Jones at 360 nm. Furthermore, the response speed and air stability of the device were significantly improved. This study presents a new approach for producing highly oriented CsCu2I3 films for stable, high-performance, and environmentally friendly optoelectronic devices.

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