Abstract

AbstractWe have calculated the stopping power of Al, Si, Ni and Cu for swift H and He ion beams. Furthermore, the energy loss straggling corresponding to Ni is also evaluated. The dielectric formalism is used combined with the MELF‐GOS method, which describes the energy loss function of the target by a linear combination of Mermin type energy loss functions for the electron outer‐shell electrons and by generalized oscillator strengths for the electron inner‐shell electrons. We take into account the corrections to the stopping power associated to capture and loss of electrons by the projectile as well as the polarization of the projectile charge density. The versatility of this method is illustrated by the good agreement between their predictions and the experimental results, which is observed for a wide range of projectile energies and targets with different electronic properties. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.