Abstract
The influence of surface roughness on emission site density (ESD) is investigated fornanotube film emitters. An empirical expression for film emitters, , where B is the intercept in the modified Fowler–Nordheim (FN) plots,ACNT the emission areaof one site, and C related to the work function, is derived from the FN theory and experimentally proved.This expression effectively excludes the influence of electric field strength, being differentfrom the conventional method of counting site numbers from emission patterns. By usingthis equation and emission patterns, variation in ESD, induced by the change incathode–anode distance, is confirmed for film emitters with rough surfaces. This variationis ascribed to the change in screen-effect strength among emission sites. It is also foundthat the smaller gaps produce the higher emission uniformity and site densities forrough-surface film emitters.
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