Dynamic Thermal Contact Resistance Measurement Method Using Lock-in Thermography

Takuya Ishizaki,Ai Ueno,Hosei Nagano,Taichi Igami

doi:10.3390/proceedings2019027042

Abstract

This paper proposes a new thermal contact resistance measurement method using lock-in thermography. By the lock-in thermography with an infrared microscope, the dynamic temperature behavior across the contact interface was visualized in the sample side surface. Meanwhile, a new thermal contact resistance measurement principle was constructed by the superimposition of the temperature wave from virtual heat sources in consideration of the thermal contact resistance at the interface. Consequently, the thermal contact resistance was obtained as a fitting parameter by fitting the theoretical curve to the measured amplitude and phase lag. The validity of the principle was shown.

Highlights

The thermal contact resistance (TCR) is a phenomenon that the heat flow is impeded at the contact interface between two materials
This paper proposes a new local TCR measurement method by a periodic heating method
TCR was estimated by fitting the theoretical curve of the amplitude and the phase lag of the temperature wave to the measurement plots

Summary

Introduction

The thermal contact resistance (TCR) is a phenomenon that the heat flow is impeded at the contact interface between two materials. The prediction theory of TCR in a non-ideal contact interface, which contains various TCR factors, is not established. In terms of TCR measurement, the steady state method is generally used to measure the comprehensive TCR across the contact interface of the bulk sample. The method to measure the local TCR in the contact interface is not established. The local TCR measurement is important to evaluate the relationship between the TCR phenomenon and TCR factors; geometrical one, mechanical one and material depended one. This paper proposes a new local TCR measurement method by a periodic heating method. It was shown that the local contact resistance can be evaluated by using this method.

Measurement Theory

Measurement Apparatus

Discussion

Conclusions