Abstract

This study proposes a new method for measuring thermal contact resistance using lock-in thermography. By using lock-in thermography with an infrared microscope, the dynamic and spatially resolved temperature behavior of the contact interface was visualized on a microscale with one measurement. In addition, a new thermal contact resistance measurement principle was constructed after solving the three-dimensional thermal conduction equation in the cylindrical coordinates by considering a periodic heat source with a Gaussian intensity distribution and the relative position of the heating point to the sample edge, in the presence of thermal resistance at the contact interface. Consequently, the discontinuous behaviors of the temperature wave, amplitude, and phase lag at the contact interface were observed on a microscale. From that discontinuity, the local thermal contact resistance was analyzed as a fitting parameter by matching the theoretical curve to the measured amplitude and phase lag. Furthermore, the simultaneous analysis of the material thermal diffusivity was demonstrated and the validity of the measurements was confirmed.

Highlights

  • Thermal contact resistance (TCR) is a phenomenon in which heat flow is impeded at the contact interface of two materials

  • This study proposes a local TCR measurement method using the periodic heating technique along with lock-in thermography (LIT)16,17 combined with an infrared microscope, which can be applied to the high-resolution microscale local TCR and the temperature response image across the contact interface, to produce only one measurement in a short time

  • This confirmed that the amplitude and the phase lag become discontinuous at the contact interface and the jump appeared there as predicted

Read more

Summary

INTRODUCTION

Thermal contact resistance (TCR) is a phenomenon in which heat flow is impeded at the contact interface of two materials. This study proposes a local TCR measurement method using the periodic heating technique along with lock-in thermography (LIT) combined with an infrared microscope, which can be applied to the high-resolution microscale local TCR and the temperature response image across the contact interface, to produce only one measurement in a short time. This method allows us to evaluate the local TCR distribution along the side edge surface of the plate-like sample

MEASUREMENT PRINCIPLE AND THEORY
Measurement apparatus
Measurement sample
Measurement conditions
RESULTS AND DISCUSSION
TCR fitting analysis
Hz heating 20 Hz heating
Simultaneous analysis for TCR and thermal diffusivity
CONCLUSION
Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call